发明名称 Method of forming a highly insulative thin films
摘要 A method of forming a highly insulative silicon oxide thin film including the steps of providing a substrate, depositing silicon on the substrate, and injecting an ion beam of oxygen or a mixed gas consisting of oxygen and an inert gas simultaneously or alternately with the depositing of the silicon. Silicon oxide may be deposited on the substrate in combination with the injection of ions of an inert gas. Other metals made be deposited along with the injection of oxygen or nitrogen cations.
申请公布号 US5122483(A) 申请公布日期 1992.06.16
申请号 US19900634528 申请日期 1990.12.27
申请人 NISSIN ELECTRIC COMPANY, LIMITED 发明人 SAKAI, SHIGEKI;OGATA, KIYOSHI;HAYASHI, TSUKASA
分类号 C23C14/10;H01L21/31;H01L21/316;H01L21/318;H01L21/822;H01L27/04 主分类号 C23C14/10
代理机构 代理人
主权项
地址