IC TEST DEVICE,申请号JP19900276257-传众专利搜索

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发明名称	IC TEST DEVICE
摘要
申请公布号	JPH04152278(A)	申请公布日期	1992.05.26
申请号	JP19900276257	申请日期	1990.10.17
申请人	HITACHI LTD	发明人	YAMAGUCHI KAZUO
分类号	G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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