| 摘要 |
PURPOSE:To enable the time of a continuity test to be substantially reduced by connecting each switching element in series, and connecting one end of the series circuit to the first power supply terminal, while the other end connected to the second power supply terminal. CONSTITUTION:The semiconductor device in the title is constituted of an input signal terminal group comprising an address terminal ADD2, a chip enable terminal CE2' and an output enable terminal OE2'' respectively connected to an internal logical circuit section 5, and an output signal terminal group 3. Also, switching elements 61 to 64 to be turned on and off depending upon voltage applied to the terminals thereof, are connected in series. One end at the series circuit is connected to the first power supply terminal 1 as a high voltage power supply VCC, while the other end connected to the second power supply terminal having low voltage VSS. When high voltage is applied to each terminal with all input/output terminals kept in contact, all switching elements 61 to 64 become electrically continuous, and current flows between the power supply terminals 1 and 4. Consequently, proper connection between all input/output terminals and a test device is instantaneously judged. |
