| 摘要 |
PURPOSE:To shorten a test pattern preparing time for a device test by independently performing access of each built-in circuit module from the outside unconnectedly with a central processing unit according to the setting of a test mode. CONSTITUTION:Interface means 13 and 14 which can be turned into signal inputting/outputting states for performing access of the circuit module from the outside in the test mode, are connected inside common buses 10 - 12 to which a central processing unit 2 and plural circuit modules are connected. Also, a one-chip microcomputer 1 is constituted by providing a controlling means 4 which pauses the operation of the central processing unit 2 according to the setting of the test mode, and separates the central processing unit 2 from the inside command buses 10 - 12. Thus, the device test of a semiconductor integrated circuit can be operated by a module unit, and the test pattern preparing time for the device test can be shortened. |
