发明名称 |
EEPROM with memory cells contg. MOS with charge layer and control gate - has transistor with drain breakdown voltage adjuster for specified operational range |
摘要 |
The FET comprises a semiconductor substrate (10), a source (24) and a drain (22) spaced from each other to define in the substrate a channel region, over which an insulated conductive layer (16), at least partially, extends in a capacitive coupling with the substrate. Over the layer an insulated control gate (20) is deposited. The FET contains additionally a device for adjusting the breakdown voltage of the drain such that it lies in the region between a first voltage capable to be applied to the drain during read-out, and a second voltage applied for discharge of the conductive layer. Pref. the drain is doped with impurity of specified density. ADVANTAGE - Large memory capacity and improved operational reliability.
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申请公布号 |
DE4135032(A1) |
申请公布日期 |
1992.04.30 |
申请号 |
DE19914135032 |
申请日期 |
1991.10.23 |
申请人 |
KABUSHIKI KAISHA TOSHIBA, KAWASAKI, KANAGAWA, JP |
发明人 |
ENDOH, TETSUO, YOKOHAMA, JP;SHIROTA, RIICHIRO, KAWASAKI, JP |
分类号 |
G11C16/04;G11C16/16;H01L27/115 |
主分类号 |
G11C16/04 |
代理机构 |
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