发明名称 EEPROM with memory cells contg. MOS with charge layer and control gate - has transistor with drain breakdown voltage adjuster for specified operational range
摘要 The FET comprises a semiconductor substrate (10), a source (24) and a drain (22) spaced from each other to define in the substrate a channel region, over which an insulated conductive layer (16), at least partially, extends in a capacitive coupling with the substrate. Over the layer an insulated control gate (20) is deposited. The FET contains additionally a device for adjusting the breakdown voltage of the drain such that it lies in the region between a first voltage capable to be applied to the drain during read-out, and a second voltage applied for discharge of the conductive layer. Pref. the drain is doped with impurity of specified density. ADVANTAGE - Large memory capacity and improved operational reliability.
申请公布号 DE4135032(A1) 申请公布日期 1992.04.30
申请号 DE19914135032 申请日期 1991.10.23
申请人 KABUSHIKI KAISHA TOSHIBA, KAWASAKI, KANAGAWA, JP 发明人 ENDOH, TETSUO, YOKOHAMA, JP;SHIROTA, RIICHIRO, KAWASAKI, JP
分类号 G11C16/04;G11C16/16;H01L27/115 主分类号 G11C16/04
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