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发明名称
IC TESTING DEVICE
摘要
申请公布号
JPH04104070(A)
申请公布日期
1992.04.06
申请号
JP19900221201
申请日期
1990.08.24
申请人
HITACHI ELECTRON ENG CO LTD
发明人
MOCHIZUKI MASAAKI;WADA YUJI
分类号
G01R31/26;G01R31/28
主分类号
G01R31/26
代理机构
代理人
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