发明名称 |
METHOD OF CLEANING SILICON SURFACE |
摘要 |
In the first step, a silicon oxide film (21) on a silicon surface (22) is etched away using a CHF3 gas. After the silicon oxide film is removed, organic matter (23) of the CxFy group remains on the silicon surface. In the second step, the organic matter (23) is etched away using a NF3 gas. The silicon oxide film (21) is etched in preference to underlying silicon (22) by using the CHF3 gas. A F radical is easily formed from the NF3 gas used for removing the organic matter (23). At the time of forming this F radical, no residue is formed which makes the silicon surface (22) dirty. Consequently, a clear silicon surface (22) is obtained.
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申请公布号 |
US5100504(A) |
申请公布日期 |
1992.03.31 |
申请号 |
US19910668677 |
申请日期 |
1991.03.07 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
KAWAI, KENJI;OGAWA, TOSHIAKI |
分类号 |
C23F4/00;H01L21/302;H01L21/306;H01L21/3065 |
主分类号 |
C23F4/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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