SEMICONDUCTOR TESTING SYSTEM,申请号JP19900217874-传众专利搜索

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发明名称	SEMICONDUCTOR TESTING SYSTEM
摘要
申请公布号	JPH0499974(A)	申请公布日期	1992.03.31
申请号	JP19900217874	申请日期	1990.08.17
申请人	MITSUBISHI ELECTRIC CORP	发明人	NAKAZURU KAZUHIRO;KOBAYASHI KUNIO
分类号	G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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