| 摘要 |
Complex integrated circuits for which internal test circuits must be provided in order to facilitate the testing of cards with several circuits. Shift register test cells are associated with each external connecting pin of the integrated circuit, such cells comprising a first multiplexer (16) for the sensing functions sending the register the logic state on the pin (10) or on a conductor (14) connecting this pin to the core of the integrated circuit, and a second multiplexer (18) for setting the state of the pin or the conductor via the state contained in the register. It is proposed that the first multiplexer should be provided with an additional input for sensing the logic state at the output of the second multiplexer. This increases the test possibilities. <IMAGE>
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