| 摘要 |
<p>PURPOSE:To eliminate fluctuation of measurement of quick contamination without sacrifice of economy of high voltage power supply or the lifespan of X-ray bulb by a method wherein an X-ray is projected from the X-ray bulb onto an object insulator, upon detection of quick contamination measuring conditions, and an operation controller operates the contamination amount of the object insulator based on the variation of intensity of fluorescent X-ray emitted from the object insulator. CONSTITUTION:Upon provision of a measuring command to an operation controller 17 under a state where a dummy insulator 8 and an object insulator 9, shown by a solid line, are held at a natural exposure position for a long term, an opening/closing mechanism 5 opens a cover 4 and an insulator position switching mechanism 10 moves the dummy insulator 8 and the object insulator 9 from the exposure position to a measuring position in a measuring chamber 2, shown by a chain line, and stops them in place. An X-ray bulb 12 then projects an X-ray 11 onto the rear surface of the object insulator 9 which then emits a fluorescent X-ray 11a to a counter 13 in which it is amplified and separated. Intensity of Cl-Kalpha fluorescent X-ray is then determined and inputted to the operation controller 17 which operates the adhesion amount of salt on the insulator.</p> |
