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发明名称
METHOD FOR MEASURING REFRACTIVE INDEX OF THIN FILM LAYER
摘要
申请公布号
US5096298(A)
申请公布日期
1992.03.17
申请号
US19890453902
申请日期
1989.12.20
申请人
RICOH COMPANY, LTD.
发明人
ISOBE, TAMI
分类号
G01N21/21;G01N21/41
主分类号
G01N21/21
代理机构
代理人
主权项
地址
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