| 摘要 |
PURPOSE:To dispense with a test pattern and enable the connection failure of all integrated circuit components to be easily detected in a short time by a method wherein an external input level and the external input level of a terminal which is to be cut are inputted into a test means, and a test output correspondent to the combination of the two levels is outputted from the test means. CONSTITUTION:Test terminals 1 and 2, an output control means 18, and a test means 19 are provided. The output control 18 outputs the outputs of an integrated circuit to correspondent output terminals. At this point, a few output terminals are cut off from integrated circuit terminals 14-17 corresponding to the input of the test input terminals, and the residual terminals are made to output at a certain level. The external input levels of all the input terminals 4-7 and the terminals to be cut are inputted into the test means 19. A prescribed test output correspondent to the combination of the input levels concerned is outputted from the test means 19. By this constitution, a few of the output terminals are made to output at a high or a low level corresponding to the test terminal input, and a test can be carried out without applying an outer input. |
