| 摘要 |
PURPOSE:To enable efficient execution of a series of operations ranging from measurement of a pole figure to an ODF (grain orientation distribution function) analysis, by incorporating a pole figure analyzing element and an ODF analyzing element in one electronic computer. CONSTITUTION:In a pole figure data collecting element 1, a diffracted X-ray is detected by an X-ray diffractometer provided with a sample stage for measurement of a pole figure. As to data thus obtained, combination of data by a transmission method with data by a reflection method and correction are executed in a pole figure analyzing element 22, absorption correction, background correction, nomalization, etc., are executed therein and the pole figure wherefrom diffraction intensity data are obtained numerically is prepared. Based on this figure, ODF is determined by a technique of a series expansion method, a vector method or the like in an ODF analyzing element 23. These analyzing elements 22 and 23 are incorporated in a control processing element 2 of one electronic computer and delivery of data is conducted efficiently. |
