首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD TO LEAK-TEST CLOSED THIN-WALL WORKPIECES
摘要
申请公布号
SU1716349(A1)
申请公布日期
1992.02.28
申请号
SU19904786977
申请日期
1990.01.29
申请人
K BYURO PRIBOROSTROENIYA N-PROIZV OBEDINENIYA "TOCHNOST"
发明人
OVCHINNIKOV YURIJ S,SU;KIRILLOV YURIJ N,SU;SHERSTNIKOV VITALIJ A,SU
分类号
G01M3/06
主分类号
G01M3/06
代理机构
代理人
主权项
地址
您可能感兴趣的专利
METHODS FOR MANUFACTURING MOLDED SHEETS HAVING A HIGH STARCH CONTENT
METHOD AND APPARATUS FOR PROVIDING SUBSCRIBER-BASED RINGBACK TONE
METHOD OF PROVIDING BURST TIMING FOR HIGH-SPEED DATA TRANSMISSION IN A BASE STATION TRANSCEIVER SYSTEM OF A MOBILE COMMUNICATION SYSTEM
A SYSTEM FOR FORMING CONTAINERS, IN PARTICULAR CONTAINERS FOR FOOD PRODUCTS
Compressor mounting
Switching power supply circuit
Carbon-porous media composite electrode and preparation method thereof
High trehalose content syrup
MOULDING COMPOSITION FOR PRODUCING BIPOLAR PLATES
Deterioration diagnosis of fuel cell seal member
A CHAIR FOR HANDICAPPED OR DISABLED PERSONS
METHOD OF MANUFACTURING A DATA CARRIER
ELECTRICAL DOMAIN MITIGATION OF POLARIZATION DEPENDENT EFFECTS IN AN OPTICAL COMMUNICATIONS SYSTEM
Semiconductor Device and Circuit Board Having the Same Mounted Thereon
METHOD FOR SUPPLYING SOLDER BALL
COMPONENT MOUNTING JIG TO SUBSTRATE
PLUNGER
LOW TEMPERATURE TREATMENT OF PCMO THIN FILM ON IR SUBSTRATE FOR USE IN RRAM
METHOD OF MANUFACTURING SOLID-STATE IMAGING APPARATUS
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF