CONTACT PROBE AND PROBE DEVICE

摘要

PROBLEM TO BE SOLVED: To prevent the occurrence of shorting due to planing chip at the time of scrubbing and prevent scrub scratch from becoming a deep scratch. SOLUTION: An inclined face 43 cutting and removing a tip of a side face 42 obliquely is formed at a tip of a contact pin 32a protruding from a film of a contact probe. The inclined face 43 is inclined in a scope of 5 to 80 deg. for a line crossing an upper face 40 orthogonally so that it extends on the side face 42 by cutting and removing a ridge line part of semicircular arc of a lower face 41 opposing to and in parallel with the upper face 40. The contact probe comes into contact with a bump 18a of an IC chip 18 on a linear crossing ridge line 44 where the inclined face 43 and the lower face 41 cross to apply scrubbing.