发明名称 TEST ADAPTOR
摘要 PURPOSE:To perform a test with use of an inexpensive tester which contains a small number of driver sensors by providing the scan circuits against the bidirectional pins of connectors for a printed board in number equal to that of bidirectional pins. CONSTITUTION:The value given from a bidirectional pin 9 is read by a scan circuit 18, and a shift lock is inputted from a shift clock terminal 20 when the clock of a clock terminal 16 is turned on. Then the shift clock is shifted to a scan circuit 21 from the circuit 18. Thus the value is read out through a scan-out terminal 22. A printed board is provided with a tester which inputs a scan mode, a clock, the scan-in data, and a shift clock. The scan-out data to be outputted is decided by the tester. A test adaptor contains the scan circuits 25 consisting of an input/output switch part 23 which switches the input and output of data and a drive/sense part 24 having the driving and sensing functions respectively in number equal to that of pins 9. Thus a test is attained with use of a tester which contains a small number of drivers and sensors.
申请公布号 JPH0423050(A) 申请公布日期 1992.01.27
申请号 JP19900127613 申请日期 1990.05.17
申请人 FUJITSU LTD 发明人 HATTORI YOSHIKAZU
分类号 G11C29/00;G06F11/22;G11C29/56 主分类号 G11C29/00
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