发明名称 DRAM using barrier layer.
摘要 <p>A memory cell comprising a MOSFET formed on a principle surface of a semiconductor substrate and an information storage capacitor having a storage electrode formed in or on the substrate so as to contact with a drain region of the MOSFET, and a capacitor electrode formed adjacent to the storage electrode with a capacitor insulator film being sandwiched between the storage electrode and the capacitor electrode. The storage electrode is connected to the drain region of the MOSFET through a thin barrier layer which is formed between the drain region and the storage electrode region so as to prevent impurities in the storage electrode from being diffused into the drain region. &lt;IMAGE&gt;</p>
申请公布号 EP0462576(A1) 申请公布日期 1991.12.27
申请号 EP19910109991 申请日期 1991.06.18
申请人 NEC CORPORATION 发明人 NARITA, KAORU
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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