发明名称 Ion lens for reducing contaminant effects in an ion guide of a mass spectrometer
摘要 An ion lens for reducing contaminant effects in an ion guide of a mass spectrometer is provided. The ion lens comprises a structural member comprising an orifice of a given radius, the structural member for supporting the ion lens at an exit region of the ion guide. The ion lens further comprises a conical member extending from the structural member, the conical member being hollow and comprising a given cone angle, and a base of the given radius, a perimeter of the base connected to a perimeter of the orifice. The conical member further comprises an aperture through an apex of the conical member, the aperture for receiving ions there through from the ion guide.
申请公布号 US9431228(B2) 申请公布日期 2016.08.30
申请号 US201113696661 申请日期 2011.05.10
申请人 DH Technologies Development Pte. Ltd. 发明人 Loboda Alexandre
分类号 H01J49/06;H01J49/26 主分类号 H01J49/06
代理机构 代理人
主权项 1. An ion lens at an exit region of an ion guide of a mass spectrometer, comprising: a structural member comprising an orifice of a given radius, said structural member for supporting said ion lens; and, a skimmer electrode having a conical shaped member extending from said structural member, said conical shaped member being hollow and comprising a given internal and external cone angle, wherein a direction of ion beam propagation being the direction of zero degrees the internal angle is less than or equal to the external angle and the internal angle is greater than zero, and a base of said given radius, a perimeter of said base connected to a perimeter of said orifice, said conical shaped member further comprising an aperture through an apex of said conical shaped member, said aperture for receiving ions there through from said ion guide.
地址 Singapore SG