| 摘要 |
An infrared absorption enhanced spectroscopic apparatus includes a reflecting face of a high refractive-index prism shaped to retain a metal layer, such as a solid plasma of aluminum, in such a way that it can be pressed uniformly against the reflecting face of the prism. Both entrance and exit faces of the prism are made sufficiently flat to minimize the scattering of infrared light when it is admitted into or emerges from the prism. A thin layer (approximately 500 ANGSTROM ) of a sample of interest is deposited on the surface of the metal layer, which overlays a flexible support member, such as a polyethylene terephthalate film having a thickness of approximately 50 mu m. The apparatus has a mechanism by which the metal layer and thin sample layer can be pressed into intimate contact with the reflecting face of the prism. The apparatus also has a mechanism for adjusting the angle of incidence of infrared light with respect to the reflecting face of the prism.
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