| 摘要 |
PCT No. PCT/US90/00122 Sec. 371 Date Sep. 12, 1990 Sec. 102(e) Date Sep. 12, 1990 PCT Filed Jan. 12, 1990 PCT Pub. No. WO90/08311 PCT Pub. Date Jul. 26, 1990.A method and apparatus for enabling analysis of a solid material (16, 42) by applying energy from an energy source (20, 70) top a surface region of the solid material sufficient to cause transient heating in a thin surface layer portion of the solid material (16, 42) so as to enable transient thermal emission of infrared radiation from the thin surface layer portion, and by detecting with a spectrometer/detector (28, 58) substantially only the transient thermal emission of infrared radiation from the thin surface layer portion of the solid material. The detected transient thermal emission of infrared radiation is sufficiently free of self-absorption by the solid material of emitted infrared radiation, so as to be indicative of characteristics relating to molecular composition of the solid material.
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