| 摘要 |
PURPOSE:To make it possible to use many kinds of first crystals by arranging the first crystal between an X-ray source and a sample, providing a first-crystal moving means and an X-ray-axis turning means, taking out the characteristics X rays, and projecting the X rays on the sample. CONSTITUTION:The X rays from an X-ray generating device 1 is diffracted through a first crystal 2 and made to be monochromatic light rays. The X rays are diffracted again with a sample 6. The intensity of the X rays is measured with a detector 7. During the measurement, a sample stage 4 is driven with a goniometer 3 and rotated by theta times at a specified time interval for every specified angle with a sample axis omegaas the center. Meanwhile, a detector arm 5 is driven with the goniometer 3 by the same way and rotated by 2theta times in the same direction as the sample stage 4 at an angle twice the that of the sample stage 4 with the sample axis omega as the center. At this time, the sample 6 is rotated by theta times like the stage 4. The X-ray detector 7 is also rotated by 2theta times like the arm 5. The well known X-ray diffraction graph is obtained by the rotation of the sample 6 and the detector 7 such as this. When another kinds is used for the first crystal, the arranged position is changed with crystal moving means such as a guide groove 14 and a protruding piece 15, and the detection is performed. |
