| 摘要 |
PURPOSE:To produce high-quality merchandise and to assure high-grade quality by measuring the X-ray diffraction intensity of the xsi phase and delta phase and either one phase of gamma phase or gamma, phase of the alloy phases constituting the plating layer of a steel sheet. CONSTITUTION:An X-ray diffraction device is installed in, for example, a line after the temper rolling at which the temp. of the steel sheet falls to <= 100 deg.C after a galvannealing treatment by heating is executed in an ordinary continuous heat treating line including a square angle heat treating stage. The diffracted X-ray intensity of the alloy phases xsi, delta, gamma, gamma1 constituting the plating layer is measured by a diffraction system of an optical system using collimated beams. A Cr-Kalpha ray is used for the X-ray and theacceleration is 40KV, 70mA. The filter is V and the average value obtd. after making measurement 10 times for the measurement time of 10 sec per phase is used. The peak intensity and the diffracted X-ray intensity of the respective backgrounds are determined at the diffraction speeds corresponding to an inter-face distance d=1.237Angstrom for the xsi phase, d=1.279Angstrom for the delta1 phase and d=1.222Angstrom for the gamma phase. The high-quality merchandise is produced in this way and the high-quality is assured. |
