发明名称 |
APPARATUS FOR MEASURING BREAKDOWN PLASMA |
摘要 |
Apparatus for measuring breakdown plasma, comprising an irradiating device for irradiating a sample with a focused light beam and for causing breakdown of a ultrafine particle to be measured in the sample at the focused beam region to change the particle into plasma; a pair of electrodes arranged on opposite sides of the focused region of the beam; and a device for measuring an electrical resistance between the electrodes under a condition where the breakdown plasma is produced between the electrodes and for determining a diameter of the particle according to the measured electrical resistance serves for accurate measurement of the diameter of the ultrafine particle in the sample.
|
申请公布号 |
US5070300(A) |
申请公布日期 |
1991.12.03 |
申请号 |
US19890390762 |
申请日期 |
1989.08.08 |
申请人 |
HITACHI, LTD. |
发明人 |
MATSUI, TETSUYA;KITAMORI, TAKEHIKO;YOKOSE, KENJI;SAKAGAMI, MASAHARU |
分类号 |
G01N15/10;G01N15/14;G01N21/71;G01N27/06;G01N27/62;G01N27/64 |
主分类号 |
G01N15/10 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|