发明名称 APPARATUS FOR MEASURING BREAKDOWN PLASMA
摘要 Apparatus for measuring breakdown plasma, comprising an irradiating device for irradiating a sample with a focused light beam and for causing breakdown of a ultrafine particle to be measured in the sample at the focused beam region to change the particle into plasma; a pair of electrodes arranged on opposite sides of the focused region of the beam; and a device for measuring an electrical resistance between the electrodes under a condition where the breakdown plasma is produced between the electrodes and for determining a diameter of the particle according to the measured electrical resistance serves for accurate measurement of the diameter of the ultrafine particle in the sample.
申请公布号 US5070300(A) 申请公布日期 1991.12.03
申请号 US19890390762 申请日期 1989.08.08
申请人 HITACHI, LTD. 发明人 MATSUI, TETSUYA;KITAMORI, TAKEHIKO;YOKOSE, KENJI;SAKAGAMI, MASAHARU
分类号 G01N15/10;G01N15/14;G01N21/71;G01N27/06;G01N27/62;G01N27/64 主分类号 G01N15/10
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