发明名称 TESTING DEVICE FOR BOTH-SIDED TWO-STAGE CONTACTING OF EQUIPPED PRINTED CIRCUIT BOARDS
摘要 A testing device for both-sided two-stage contacting of equipped printed circuit boards. A lower needle adaptor has first and second resilient or spring-seated contact needles of different lengths and an upper needle adaptor has third and fourth resilient or spring-seated contact needles also differing in length, which are provided for both-sided, two-stage contacting of component equipped printed circuit boards. In all stages of the contacting, the printed circuit boards are firmly clamped between lower and upper pressure rams arranged test-specimen-associated. The testing device provides a high contacting reliability.
申请公布号 US5068600(A) 申请公布日期 1991.11.26
申请号 US19900528340 申请日期 1990.05.23
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 HILZ, WOLFGANG;SCHUSTER, RUDOLF;SCHAUFLINGER, HANS
分类号 G01R1/073 主分类号 G01R1/073
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