发明名称 |
TESTING DEVICE FOR BOTH-SIDED TWO-STAGE CONTACTING OF EQUIPPED PRINTED CIRCUIT BOARDS |
摘要 |
A testing device for both-sided two-stage contacting of equipped printed circuit boards. A lower needle adaptor has first and second resilient or spring-seated contact needles of different lengths and an upper needle adaptor has third and fourth resilient or spring-seated contact needles also differing in length, which are provided for both-sided, two-stage contacting of component equipped printed circuit boards. In all stages of the contacting, the printed circuit boards are firmly clamped between lower and upper pressure rams arranged test-specimen-associated. The testing device provides a high contacting reliability.
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申请公布号 |
US5068600(A) |
申请公布日期 |
1991.11.26 |
申请号 |
US19900528340 |
申请日期 |
1990.05.23 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
HILZ, WOLFGANG;SCHUSTER, RUDOLF;SCHAUFLINGER, HANS |
分类号 |
G01R1/073 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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