发明名称 TEST CONTROL METHOD FOR INFORMATION PROCESSING SYSTEM
摘要 PURPOSE:To improve the test accuracy, to eliminate the selection of tests carried out based on the experiences, and to shorten the test time by providing a function to accumulate the information on the past hardware faults and at the same time carrying out the tests based on the accumulated information and in the order of items having higher error occurrence frequencies. CONSTITUTION:A test priority analyzing program 4 analyzes the information stored in a test frequency logging part 6 where the results of execution of the hitherto test programs 7a - 7m are accumulated under the control of a test control program 3. Then the information on the part 6 is obtained in response to a table group 5, and the priority is decided among test items based on the test items, the error factors, and the error occurrence frequencies. The program 3 carries out the programs 7a - 7m based on the decided priority and accumulates the test results in the part 6. In such a way, the test items are decided with preference based on the error factors obtained from the results of actual hardware tests. Thus the selection of tests performed based on the experiences of workers can be omitted. As a result, the test accuracy is improved and the test time is shortened.
申请公布号 JPH03257538(A) 申请公布日期 1991.11.18
申请号 JP19900055104 申请日期 1990.03.08
申请人 HITACHI LTD;HITACHI NISHI SHIYOUHIN ENJINIARINGU KK;HITACHI CHIYUUBU SOFUTOUEA KK 发明人 SATO KENJI;HARADA HIROYUKI;FUJII TOSHIHARU;ABE KIYOYA
分类号 G06F11/22 主分类号 G06F11/22
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