| 摘要 |
PURPOSE:To improve working efficiency in the generation of a test pattern by performing the setting of an assumptive fault, the decision of a signal route to propagate a fault, that of the value of an element, recovery when the propagation of the fault is disabled in the middle way in interactive fashion. CONSTITUTION:A processing part 3 stores command information in a temporary storage part 4, and also, performs fault propagation processing in the generation of the test pattern in accordance with a command. The temporary storage part 4 is the one to store history information in a process to find the test pattern for one fault, and it stores, for example, a propagation route, the logical values of input and output signals of the element, and fault information such as a fault value, etc. A storage part 5 stores logical connection information consisting of at least two hierarchies, logic circuit plotting information, and test pattern information, etc., and a display part 6 displays a logic circuit diagram and a fault propagation route, the logical value and the fault value, and selective support information for a branch signal, etc., based on the command from the processing part 3. Thereby, the test pattern can be obtained with high efficiency. |
