| 摘要 |
The solution concerns a measuring of ability to display fine structure in devices for transmission and recording of image, i.e. measuring properties connected with the function of transmission of modulation, sharpness, and resolution capabilities. The principle of the solution consists in a diffractometric analysis of image record, made by the measured device for image transmission, where test diagram is displayed, with at least two systems of periodically arranged elements, which differ in space frequencies. From the ratio of intensities of deflection maxims frequency properties of the measured device are evaluated. The procedure is intended mainly for measuring of properties of device for copying, enlarging etc. of image for photographic materials.
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