TESTING CIRCUIT FOR RANDOM ACCESS MEMORY DEVICE,申请号EP19870109030-传众专利搜索

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发明名称	TESTING CIRCUIT FOR RANDOM ACCESS MEMORY DEVICE
摘要
申请公布号	EP0253161(B1)	申请公布日期	1991.10.16
申请号	EP19870109030	申请日期	1987.06.24
申请人	NEC CORPORATION	发明人	TANIGAWA, TAKABO
分类号	G11C29/00;G11C11/401;G11C11/409;G11C29/34	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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