DEVICE FOR TESTING ELECTRONIC PARTS,申请号JP19900007844-传众专利搜索

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发明名称	DEVICE FOR TESTING ELECTRONIC PARTS
摘要
申请公布号	JPH03211851(A)	申请公布日期	1991.09.17
申请号	JP19900007844	申请日期	1990.01.17
申请人	FUJITSU LTD;FUJITSU VLSI LTD	发明人	ISHIMOTO SATOSHI
分类号	G01R31/26;H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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