发明名称 Exposure apparatus.
摘要 An exposure method for manufacture of semiconductor devices, includes moving a shutter having an edge so that the edge is related to a predetermined exposure region; projecting an exposure beam to the edge of the shutter and to at least a portion of the exposure region; determining a position of a shadow of the edge of the shutter formed by the exposure beam with respect to a predetermined coordinate system related to movement of a movable chuck; adjusting the shutter in accordance with the determination; placing a substrate on the chuck; moving the chuck so that the substrate is related to the exposure region; and controlling the exposure of the substrate with the exposure beam through the shutter. <IMAGE>
申请公布号 EP0446076(A2) 申请公布日期 1991.09.11
申请号 EP19910301974 申请日期 1991.03.08
申请人 CANON KABUSHIKI KAISHA 发明人 MIZUSAWA, NOBUTOSHI, C/O CANON KABUSHIKI KAISHA;EBINUMA, RYUICHI C/O CANON KABUSHIKI KAISHA;KUROSAWA, HIROSHI, C/O CANON KABUSHIKI KAISHA;UDA, KOJI, C/O CANON KABUSHIKI KAISHA;KARIYA, TAKAO, C/O CANON KABUSHIKI KAISHA;UZAWA, SHUNICHI, C/O CANON KABUSHIKI KAISHA
分类号 G03F7/20 主分类号 G03F7/20
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