发明名称 Dynamic viscoelasticity measurement apparatus with output signal offset correction
摘要 An apparatus for dynamic measurement of viscoelasticity of a sample through oscillating displacement thereof. A detector detects oscillating displacement of a sample and produces a corresponding displacement signal having top and bottom peaks and containing an amplitude component due to the oscillating displacement and an offset component due to long-term deformation of the sample. A driver shifts the detector relative to the sample. A measurement circuit measures values of the top and bottom peaks of the displacement signal. A CPU calculates the amount of the offset component according to the measured value of the top and bottom peaks and outputs a compensative signal based on the calculated amount of the offset component to the driver so that the driver shifts the detector relative to the sample according to the compensative signal to cancel the deformation of the sample to thereby remove the offset component from the displacement signal.
申请公布号 US5046367(A) 申请公布日期 1991.09.10
申请号 US19900500289 申请日期 1990.03.28
申请人 SEIKO INSTRUMENTS, INC. 发明人 IIZUKA, NOBUO
分类号 G01B21/00;G01B21/32;G01N3/00;G01N3/08;G01N3/38;G01N19/00 主分类号 G01B21/00
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