发明名称 PHOTOMASK
摘要 PURPOSE:To obtain a fine pattern as well as to faithfully form the pattern of a photomask by rendering an angle of inclination to the edge of a light shielding film when this film is formed on a glass substrate. CONSTITUTION:A light shielding film 11b of chromium, chromium oxide, iron oxide, etc., is formed on a glass substrate 10a by sputtering or vapor deposition and coated with a photoresist film 40 of a high molecular material. The films 10b, 40 are brought into a reaction by irradiation with UV to draw a pattern and the edge of the film 10b is undercut or side-etched by liq. phase etching. The edge of the film 10b is inclined and a photomask 10 is completed. The pattern of the photomask can be faithfully formed and a fine pattern is obtd.
申请公布号 JPH03197950(A) 申请公布日期 1991.08.29
申请号 JP19890341422 申请日期 1989.12.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 YAMA YOMIJI;KAMON KAZUYA
分类号 G03F1/54;H01L21/027 主分类号 G03F1/54
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