| 摘要 |
<p>A two dimensional image of the voltage distribution across a surface (14) at a large plurality voltage test points of a panel under test (16) is extracted by illuminating the surface (14) with an expanded, collimated beam (24) of optical energy (20) of a known polarization state through an electro-optic modulator (30), such as KDP, wherein the crystal is disposed to allow longitudinal probing geometries such that a voltage on the surface (14) of the panel under test (16) causes a phase shift in the optical energy (the electro optic effect) which can be observed through an area polarization sensor (44, 45, 46, 48) for use to directly produce a two-dimensional spatially-dependent power modulation image directly representative of the spatially corresponding voltage state on the surface of the panel under test (16). Surface cross-talk is minimized by placing the face of the crystal closer to the panel under test (16) than the spacing of voltage sites in the panel under test (16). The device may operate in a pass-through mode or in a reflective mode. An etalon may be used to enhance sensitivity.</p> |
