| 摘要 |
Circuit boards, chips and analogous components having a large number of electric contacts are contacted with an adapter wherein the rear ends of elongated flexible resilient test probes are affixed to a platelike support and the front ends of the probes extend or can extend beyond the holes of a front plate which is maintained at a fixed distance from the support. Intermediate portions of the probes extend with play through openings in a plate-like flexing member which is movable by a fluid-operated motor in a first direction in parallelism with the front plate to flex the probes preparatory to placing of the front plate and a component to be tested next to each other so that the contacts of the component engage or are adjacent the front ends of the probes. The flexing member thereupon permits the probes to dissipate or to tend to dissipate at least some of the stored energy and urge their front ends against the adjacent contacts. The flexing member can be positively moved in a second direction counter to the first direction to flex the probes in the second direction while the front ends of the probes already bear against the adjacent contacts. This increases the pressure between the front ends and the contacts. |
