| 摘要 |
<p>A method matching patterns includes the steps of optically scanning a master image (a) and a to-be-recognized image (d) and outputting master image data and to-be-recognized image data, extracting master outline data representing an outline (b) of the master image from the master image data, extracting to-be-recognized outline data representing an outline (e) of a to-be-recognized image from the to-be-recognized image data, performing an enlargement process for the to-be-recognized outline data to enlarge the to-be-recognized outline, thereby forming to-be-recognized outline data, and collating the master outline data with the to-be-recognized outline data, and if a portion of the master outline projects from the to-be-recognized outline, determining that the to-be-recognized image has a short-defect indicating an omission of the image. <IMAGE></p> |
