| 摘要 |
A method and apparatus for determining object characteristics such as shape and relative electrical conductivity and for resolving specular and diffuse components of reflection are disclosed. These object characteristics are determined by measuring the following polarization parameters of reflected light from the object surface: (i) the magnitude of the minimum polarization component, (ii) the magnitude of the maximum polarization component, and (ii) the directional orientation of the minimum polarization component. These parameters are used to ascertain at an object point the specular plane and the ratio of the Fresnel reflection coefficients, perpendicular to parallel, with respect to the specular plane. Both of these are used for the determination of the surface normal at object points. The numerical value of the Fresnel reflection coefficient is used to discriminate between surfaces of varying electrical conductivity, lower values indicating highly conductive metals, higher values indicating poorly conducting dielectrics. The numerical value of the Fresnel reflection coefficient is used to resolve specular and diffuse reflection components.
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