Semiconductor device for performing automatic replacement of defective cells

摘要

A semiconductor device includes a main storage section for storing data. A spare storage section is disposed in association with the main storage section so as to serve as a redundancy circuit for replacing a deflection element of the main storage section. A temporary storage section is disposed in association with the main storage section to store the data temporarily. A comparator section makes a comparison between the data stored in the main storage section and the data stored in the temporary storage section to provide a comparison result. A switching section is responsive to the comparison result output from the comparator section to replace the defective element with the spare storage section.