发明名称 |
Static semiconductor memory device with predetermined threshold voltages |
摘要 |
A high resistance/load type memory cell of a static semiconductor memory device includes two load elements, two driver transistors, and two access transistors. The threshold voltage of each driver transistor is set at a high value so that the OFF resistance value of the driver transistor is 10 to 100 times the resistance value of each load resistance. The threshold voltage of each access transistor is set to be lower than the threshold voltage of each driver transistor so that the OFF resistance value of the access transistor is twice to 10 times the resistance value of each load resistance. Thus, power consumption in a standby state is reduced, while data holding characteristics of the memory cell are stabilized in selected and non-selected states.
|
申请公布号 |
US5020029(A) |
申请公布日期 |
1991.05.28 |
申请号 |
US19900547263 |
申请日期 |
1990.07.03 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
ICHINOSE, KATSUKI;WADA, TOMOHISA |
分类号 |
G11C11/412 |
主分类号 |
G11C11/412 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|