发明名称 RANDOM ACCESS MEMORY
摘要 PURPOSE:To contrive the shortening of the inspection time for checking the interference of adjacent cells of memory cells by allowing output lines from a decoder selecting the cell in the memory cells to be simultaneously the selecting state at every other piece. CONSTITUTION:Among the output lines from the decoders 111, 112 to select the memory cell by input signals S1, S2 entering the decoders 111, 112 selecting the cell among the memory cell array, the output lines at every other piece are simultaneously set so as to become the selecting state. And by arranging most suitably the decoder output signal line for the arrangement of the memory cell, with the decoders 111, 112 respectively twice a total 4 times of writing operation, the checked pattern writing to check the interference of the adjacent cells of the memory cell is finished. In such a manner, regardless of the memory capacity the checked pattern can be written for the all memory cells in a short time, so that the inspecting time is shortened.
申请公布号 JPH03113895(A) 申请公布日期 1991.05.15
申请号 JP19890253141 申请日期 1989.09.28
申请人 NEC CORP 发明人 FUNAHASHI NORIO
分类号 G11C11/413;G11C11/401;H01L27/10 主分类号 G11C11/413
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