发明名称 Apparatus and method for normal incidence reflectance spectroscopy
摘要 An external reflectance spectroscopy apparatus and method are disclosed in which maximum radiation througput is obtained by using a beamsplitter which reflects half of a collimated beam and transmits the other half. In order to obtain reliable results, the condition of perpendicular incidence on the sample is approximated (without limiting throughput) by providing a beamsplitter having an uneven number of reflecting blades and the same number of transmitting openings. Each reflecting blade is opposite to an open area having the same size and shape. The result is a substantial equalizing of contributions from rays polarized parallel to the plane of incidence and from rays polarized perpendicular to the plane of incidence.
申请公布号 US5015100(A) 申请公布日期 1991.05.14
申请号 US19900487633 申请日期 1990.03.02
申请人 AXIOM ANALYTICAL, INC. 发明人 DOYLE, WALTER M.
分类号 G01N21/35;G01N21/55;G02B27/10 主分类号 G01N21/35
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