发明名称 |
METHOD AND APPARATUS FOR MEASURING AND/OR DISCRIMINATING SURFACE STRUCTURE |
摘要 |
PURPOSE: To also measure the structure under a surface simultaneously with a surface structure by fitting and adjusting a wavelength of ultrasonic waves to the structure of matter. CONSTITUTION: A hermetically closed box 1 filled with a liquid has a support surface 2 on the side of its bottom part and matter 3 to be inspected and analyzed is pressed to the support surface 2. The transmitter 4 and receiver 5 within the box 1 are arranged on the support 6 moved along the track within the box 1 and the support 6 is guided along the track of motion. By this constitution, the local space frequency spectrum of the matter (fingertip) 3 is measured. In this case, an ultrasonic generator 12 operates the transmitter 4 through a switch 13 and a control unit 15 adjusts the accurate lasting time of a signal. A receiving signal is sent to an analyser through a detector 17. |
申请公布号 |
JPH03103763(A) |
申请公布日期 |
1991.04.30 |
申请号 |
JP19900151774 |
申请日期 |
1990.06.12 |
申请人 |
BIISURAFU BITSUTSU;BORUFUGANGU GURIRU |
发明人 |
BORUFUGANGU GURIRU |
分类号 |
G01B17/00;A61B5/117;G01B17/08;G01N29/00;G01N29/04;G01N29/34;G01S15/89 |
主分类号 |
G01B17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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