发明名称 PATTERN INCLINATION CHECKING DEVICE
摘要 PURPOSE:To detect the inclination of a complicated pattern by obtaining an edge direction distribution signal corresponding to the inclination with respect to each of an object pattern and a standard pattern and detecting the inclination between the correlation function between them. CONSTITUTION:An edge distribution detecting circuit 5 uses an edge direction detecting operator to calculate directions of pattern edges of a digital picture 4 in the range from -90 deg. to +90 deg. and accumulates directions of respective pattern edges in a designated area and obtains the edge distribution to angles to output an edge distribution signal 6, and this signal is stored in an object pattern storage circuit 8. The standard pattern is subjected to the same processing, and the result is stored in a standard pattern storage circuit 7, and a correlation function 12 is calculated in a correlation function calculating circuit 11 based on an object pattern signal 10 and a standard pattern signal 9, and an inclination calculating circuit 13 calculates the inclination by points which give a maximum value of the correlation function 12. Thus, the inclination of the complicated pattern is detected.
申请公布号 JPH03100777(A) 申请公布日期 1991.04.25
申请号 JP19890238621 申请日期 1989.09.13
申请人 NEC CORP 发明人 YOKOI SADAAKI
分类号 G06T7/60 主分类号 G06T7/60
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