发明名称 |
Apparatus and method for particle removal by forced fluid convection. |
摘要 |
<p>An apparatus and method for removing contaminant particles from a surface, such as a semiconductor wafer (12), using the effect of a phase change of a condensate fluid, from liquid to solid form, on the adhesion force between a contaminant particle and a surface. Contaminant particles (172) are removed from a surface by wetting the particles with a thin film (20) of a removal fluid of a type that exhibits a volume expansion during a liquid to solid phase change, and then freezing the removal fluid to cause such expansion . Frozen material (21) including contaminant particles (172) is then removed from the surface by melting and throw-off of frozen material. Steam may be used for both the removal fluid and for melting the frozen material.</p> |
申请公布号 |
EP0423761(A2) |
申请公布日期 |
1991.04.24 |
申请号 |
EP19900119918 |
申请日期 |
1990.10.17 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
LORIMER, D'ARCY;LIU, BENJAMIN Y.H.;BAKER, EDWARD;AHN, KANG HO |
分类号 |
B08B7/00;H01L21/00;H01L21/304;H01L21/306 |
主分类号 |
B08B7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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