摘要 |
PURPOSE:To improve the azimuth resolution and depth resolution and to obtain an image with high resolution by providing a high-frequency band correcting means which increases in gain as the frequency characteristics of electric signal amplification increase. CONSTITUTION:A waveform generating circuit 20 generates a bias voltage, which is applied to a variable high frequency band correcting circuit 10. Consequently, the high frequency band of a reflected wave which is reflected at a deeper position in a sample 104 and received a longer delay time later is amplified large and the attenuation of the spectrum intensity in the high frequency band can be corrected. Therefore, the azimuth resolution of an internal image of the sample 104 can be improved and the depth resolution when a three- dimensional image is formed can be improved, so that the image with extremely high resolution is obtained. Further, data after the attenuation in the sample is corrected can be obtained and this data is outputted to an instrument 114 for material property quantitative measurement, which is carried out to enable extremely accurate measuring operation. |