发明名称 Adjustable electronic graticules for measuring waveform distortions
摘要 Adjustable electronic graticules for measuring waveform distortions are generated from operator inputs indicating a measurement mode and a scale factor. A template of a graticule for the measurement mode in the form of a display list of move and draw instructions is scaled by the scale factor and a measurement value is computed from the scale factor and the instrument units per division setup. The graticule and measurement value are stored as a modified display list. A readout engine interprets the modified display list and produces electrical signals for drawing the graticule and measurement value on a display monitor. The electrical signals are combined with the waveform for display on the display monitor. The operator varies the scale factor until the displayed graticule touches the waveform at a measurement point, and the measurement value is accordingly displayed.
申请公布号 US5004975(A) 申请公布日期 1991.04.02
申请号 US19900546270 申请日期 1990.06.28
申请人 TEKTRONIX, INC. 发明人 JORDAN, DALE A.
分类号 G01R13/30;G01R23/20 主分类号 G01R13/30
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