| 摘要 |
PURPOSE:To perform a test at the time of incorporating an LSI in a system by setting a high impedance state at a position temporally before and after an output signal as an inconstant value signal and the high impedance state other than the inconstant value signal as the signal of '1' or '0'. CONSTITUTION:At first, an ordinary pattern is generated and simulation is performed so as to discriminate whether or not each terminal gets is states 'H' and 'L' or the high impedance state 'Z'. When it is confirmed that the action of each terminal coincides with an expected value, processing is finished, and when it is confirmed that the action thereof does not coincide with the expected value, the processing is repeated. A test pattern changing device 6 changes the state 'Z' to another state and a test pattern for performing the logical test of the LSI by supposing the packaging state in the case of the simulation in a computer is generated. Then, a test pattern for performing a test without actual load circuit on a measuring board 4 is generated. Since the LSI chip is tested in a state where it is incorporated in an actual system, a logical error such as a malfunction caused by the through use of an external signal is detected. |
