发明名称 Non-destructive sectional shape inspecting method and apparatus
摘要 A non-destructive sectional shape inspecting apparatus and method. An object to be inspected is internally and/or externally filled with a material capable of reradiating a nuclear magnetic resonance signal, whereon high frequency pulses and gradient magnetic fields are applied to obtain a nuclear magnetic resonance signal which is processed into an image signal. A portion of the image signals where no nuclear magnetic resonance signal makes appearance is extracted to be utilized for plotting the sectional shape of the object under test.
申请公布号 US4998065(A) 申请公布日期 1991.03.05
申请号 US19890369253 申请日期 1989.06.20
申请人 HITACHI, LTD. 发明人 KOIZUMI, HIDEAKI
分类号 A61B5/055;G01B1/00;G01B7/00;G01B7/28;G01N24/00;G01R33/44 主分类号 A61B5/055
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