发明名称 |
Method for fabrication of self-aligned asymmetric field effect transistors |
摘要 |
A method for fabrication of a field effect transistor includes forming an insulator film of a proper thickness at a predetermined region on one principal surface of a compound semiconductor substrate, forming a gate electrode of a refractory metal on a side wall of the insulator film in a self-alignment manner, and implanting ions with a mask of the insulator film and the gate electrode to form ion implanted regions in the substrate asymmetrically with respect to the gate electrode.
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申请公布号 |
US4992387(A) |
申请公布日期 |
1991.02.12 |
申请号 |
US19900496300 |
申请日期 |
1990.03.20 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
TAMURA, AKIYOSHI |
分类号 |
H01L29/812;H01L21/28;H01L21/338;H01L29/08 |
主分类号 |
H01L29/812 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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