发明名称 Method for fabrication of self-aligned asymmetric field effect transistors
摘要 A method for fabrication of a field effect transistor includes forming an insulator film of a proper thickness at a predetermined region on one principal surface of a compound semiconductor substrate, forming a gate electrode of a refractory metal on a side wall of the insulator film in a self-alignment manner, and implanting ions with a mask of the insulator film and the gate electrode to form ion implanted regions in the substrate asymmetrically with respect to the gate electrode.
申请公布号 US4992387(A) 申请公布日期 1991.02.12
申请号 US19900496300 申请日期 1990.03.20
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 TAMURA, AKIYOSHI
分类号 H01L29/812;H01L21/28;H01L21/338;H01L29/08 主分类号 H01L29/812
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