Test pattern generator for working behaviour of microprocessor - produces simulation unit from input data unit with descriptive elements characteristic of processor

摘要

The data unit (DIN) runs through a list of all functions of the integrated component, esp. a microprocessor, entered according to priority. The unit ascertains the functions to be executed, reads cut their associated sequence and stores in an output data unit. The execution sequence is converted to a precision pulse cycle by a grading unit (TE) following the simulation unit (SE). The pulse series produces is converted to a binary test bit pattern for storage in a test data unit (CHD) by conversion unit (VE). USE/ADVANTAGE - Simulation of functional behaviour without having to correct integrated components esp. microprocessor, in circuitry.