发明名称 Surface topology simulation device for semiconductor substrate - uses network topology with approximation of movement of treated surface by movement of surfaces with same conc.
摘要 The surface topology simulation device allows the region of the substrate surface including the area to be treated to be divided into a number of partial zones with a network Topology (31) corresponding to the structure and surface topology of the semiconductor. The movement of the treated substrate surface is approximated by the movement of surfaces with the same conc as the diffused particle cone, with calculation of the diffusion coefficients for each partial zone. The surfaces exhibiting the same conc are calculated to allow a 3-dimensional surface topology to be provided USE - For semiconductor substrate etching process.
申请公布号 DE4010132(A1) 申请公布日期 1991.01.17
申请号 DE19904010132 申请日期 1990.03.29
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 KUNIKIYO, TATSUYA;FUJINAGA, MASATO;KOTANI, NORIHIKO, ITAMI, HYOGO, JP
分类号 C30B23/08;G06F17/50;H01L21/00;H01L21/20;H01L21/205;H01L21/31 主分类号 C30B23/08
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